· 제품정보

microLED(miniLED) Display: - microLED Laser Lift-off System-DPSS; - microLED Laser Lift-off System-Excimer; - microLED Laser Bonding System; - miniLED Transfer System; - miniLED Laser Repair System

Semiconductor: - Wafer Back-side Laser marking system; - Die Inspection & Sorting System; - Wafer Spin Coater - CIS; - Wafer Spin Remover - CIS; - Die Transfer

Probe Card: - Laser Drilling System - MEMS Probe Card; - Auto Pin Insert System - MEMS Probe Card

Laser: - microLED Laser Lift-off System-DPSS; - microLED Laser Lift-off System-Excimer; - microLED Laser Bonding System; - miniLED Laser Repair System; - Laser Drilling System - MEMS Probe Card; - Wafer Laser Full cutting System - Sapphire; - Laser Scribing System; - Laser Marking System

Camera Module: - VICSEL Tester; - Tray Cover Attaching System; - Laser Marking System - Shield Can

Conventional LED: - Wafer Laser Full cutting System - Sapphire; - LED Test Handler; - Taping Machine; - Sorter; - Prober; - Dispenser; - Phosphor Coater; - CSP Blade Cutter

· 회사소개

· 고객지원

Conventional LED
LED Test Handler

LPH Series

LPH-100

QMC LPH-100 설비는 Driver IC 가 내장된 R,G,B PKG의 파장(Wd), 광도(Iv)를 측정하여 사용자가 지정한 값으로 Calibration하여 최종 Target Spec. 값을 EPROM에 Writing하여 양/불 판정 및 분류하는 설비입니다.

OUTPUT

FEATURES

All in One System; Test and Calibration
빠르고 안정적인 광특성 보정
High Throughput
Tact time ≤ 6 sec/PKG
UPH ≥ 600 PKG/hour

SPECIFICATION

Item	LPH-100
PKG Size	3.0 x 3.0 mm, 1.4t
Bowl Feeder	Max. 600 ea/min
Bin	10 ea
Configuration	Bowl Feeder, Bin Sorting, Index, Contact, Pick & Place Tool, Prober
System Dimension(W x D x H)	1,150mm x 1,000mm x 1,850mm
Throughput Tact Time	6.0 sec/PKG
Throughput UPH	600 PKG/hour
Test item	IC Current, Temp, R/G/B/W IV, PWM
Vision	1/1.8” Camera, Pixel Resolution 5.5μm
Load/Un-Load	Bowl Feeder / Bin Can
Copntrol S/W	PC Control